Size Effects in Thin Films
A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.
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| UPC | 9781483289762 |
|---|---|
| Author | Tellier, C. R., Tosser, A. J., Siddall, G. |
| Pages | 0 |
| Language | English |
| Format | |
| Publisher | North Holland |
| SKU | 9781483289762 |
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