Electronics Reliability and Measurement Technology
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
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| UPC | 9780815517009 |
|---|---|
| Author | Joseph S. Heyman |
| Pages | 140 |
| Language | English |
| Format | |
| Publisher | Elsevier Science |
| SKU | 9780815517009 |
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